Differential ion beam sputtering of segregated phases in aluminum casting alloysNGUYEN, Chuong L; WIRTZ, Tom; FLEMING, Yves et al.Applied surface science. 2013, Vol 265, pp 489-494, issn 0169-4332, 6 p.Article

Universal Equation for Argon Gas Cluster Sputtering YieldsSEAH, M. P.Journal of physical chemistry. C. 2013, Vol 117, Num 24, pp 12622-12632, issn 1932-7447, 11 p.Article

Development of a high-performance electrospray droplet beam sourceNINOMIYA, Satoshi; CHUIN CHEN, Lee; SAKAI, Yuji et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 126-130, issn 0142-2421, 5 p.Conference Paper

Differential sputtering and the formation of repeating fragments in ToF-SIMS spectra of light metal alloy surfacesNGUYEN, Chuong L; METSON, James B.Surface and interface analysis. 2013, Vol 45, Num 1, pp 449-452, issn 0142-2421, 4 p.Conference Paper

Emission characteristics of a charged-droplet beam source using vacuum electrospray of an ionic liquidFUJIWARA, Yukio; SAITO, Naoaki; NONAKA, Hidehiko et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 517-521, issn 0142-2421, 5 p.Conference Paper

First in situ Optical Emission Spectroscopy measurements during cesium low-energy depth profilingMINE, N; HOUSSIAU, L.Surface and interface analysis. 2013, Vol 45, Num 1, pp 61-64, issn 0142-2421, 4 p.Conference Paper

High resolution SIMS analysis of arsenic in riceMOORE, Katie L; HAWES, Chris R; MCGRATH, Steve P et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 309-311, issn 0142-2421, 3 p.Conference Paper

Matrix and primary ion-related aspects of tryptophan SIMS analysisSTUPAVSKA, M; JERIGOVA, M; VELIC, D et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 68-71, issn 0142-2421, 4 p.Conference Paper

Modeling dynamic cluster SIMS experimentsGARRISON, Barbara J; SCHIFFER, Zachary J; KENNEDY, Paul E et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 14-17, issn 0142-2421, 4 p.Conference Paper

New sample holder geometry for high precision isotope analysesPERES, P; KITA, N. T; VALLEY, J. W et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 553-556, issn 0142-2421, 4 p.Conference Paper

Novel method to prepare biological samples using powerful magnets on TOF-SIMS analysisCHANG, Chun-Chao; CHEN, Chun-Nan; LIN, Wei-Jhih et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 248-250, issn 0142-2421, 3 p.Conference Paper

Physical characterization of sub-32-nm semiconductor materials and processes using advanced ion beam―based analytical techniquesHOPSTAKEN, M. J. P; PFEIFFER, D; SADANA, D. K et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 338-344, issn 0142-2421, 7 p.Conference Paper

Quantification of Ge in Si_1-xGe_x by using low-energy Cs⁺ and O₂⁺ ion beamsPURETI, Rathaiah; VANDERVORST, W.Surface and interface analysis. 2013, Vol 45, Num 1, pp 402-405, issn 0142-2421, 4 p.Conference Paper

Quantitative detection of purines in biologically relevant films with TOF-Secondary Ion Mass SpectrometryJACKSON, Lauren M; HUE, Jonathan J; WINOGRAD, Nicholas et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 237-239, issn 0142-2421, 3 p.Conference Paper

RFS ratio of silicon in III-V compound semi-conductor measured with different offset voltageYAMAMOTO, H; FUJIMOTO, H; NISHITANI, T et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 417-419, issn 0142-2421, 3 p.Conference Paper

Strong-field ionization of C₆₀ sputtered neutral molecules using 10¹⁵W/cm² of fs IR radiationKUCHER, Andrew; WINOGRAD, Nicholas.Surface and interface analysis. 2013, Vol 45, Num 1, pp 510-512, issn 0142-2421, 3 p.Conference Paper

Surface sputtering with nanoclusters: the relevant parametersDELCORTE, A; RESTREPO, O. A; CZERWINSKI, B et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 9-13, issn 0142-2421, 5 p.Conference Paper

TiO₂ photocatalytic degradation of cholesterol: SIMS studyPROCHAZKA, M; STUPAVSKA, M; JERIGOVA, M et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 22-26, issn 0142-2421, 5 p.Conference Paper

ToF-SIMS as a tool for metabolic profiling small biomolecules in cancer systemsKOTZE, Helen L; ARMITAGE, Emily G; FLETCHER, John S et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 277-281, issn 0142-2421, 5 p.Conference Paper

Ultra low energy O⁺₂ SIMS depth profiling of superficial poly(CuPc) and Co(II)T(o-NH2)PP monomolecular layersDOWSETT, M. G; MORRIS, R. J. H; ADRIAENS, A et al.Surface and interface analysis. 2013, Vol 45, Num 1, pp 324-328, issn 0142-2421, 5 p.Conference Paper

Comparison of a new dead-time correction method and conventional models for SIMS analysisTAKANO, Akio; TAKENAKA, Hisataka; ICHIMARU, Satoshi et al.Surface and interface analysis. 2012, Vol 44, Num 9, pp 1287-1293, issn 0142-2421, 7 p.Article

Dynamics of the Oxygen Molecules Scattered from the Graphite (0001) Surface and Comparison with Experimental DataMORON, Victor; MARTIN-GONDRE, Ludovic; GAMALLO, Pablo et al.Journal of physical chemistry. C. 2012, Vol 116, Num 40, pp 21482-21488, issn 1932-7447, 7 p.Article

Quantification of grain boundary equilibrium segregation by NanoSIMS analysis of bulk samplesCHRISTIEN, F; DOWNING, C; MOORE, K. L et al.Surface and interface analysis. 2012, Vol 44, Num 3, pp 377-387, issn 0142-2421, 11 p.Article

Sputtering Yields for Gold Using Argon Gas Cluster Ion BeamsLI YANG; SEAH, Martin P; GILMORE, Ian S et al.Journal of physical chemistry. C. 2012, Vol 116, Num 44, pp 23735-23741, issn 1932-7447, 7 p.Article

Improvement of anti-oxidation capability and tribological property of arc ion plated Ag film by alloying with CuXIAOMING GAO; JIAYI SUN; MING HU et al.Applied surface science. 2011, Vol 257, Num 17, pp 7643-7648, issn 0169-4332, 6 p.Article